User manual HAMEG HM203-4

[. . . ] The unit exhibits visible damage The unit contains loose parts The unit no longer functions The unit has been stored under unfavorable conditions (e. Out of doors or in a moist area) for a long period of time The unit has been subjected to ahnornial stresses during transport (e. As a result of not being packaged in accordance with the minirnurn requirements of the postal service, railway or shipping company). The BNC jacks and the black banana jack are grounded by way of the 3-conductor power cord of the HZ65. [. . . ] In the case of circuits which are themselves grounded by way of their power connection, it is necessary to pull the power plug of the component tester. Warranty A limited warranty is granted covering proper functioning of the HZ65 for a period of 2 years. This warranty is void if unauthorized changes have been made on the unit. When mailing or shipping by rail, we recommend packaging the unit very carefully. Damage caused during transport by inadequate packaging is exempted from the warranty. When exercising this warranty, we advise attaching a note to the housing of the unit briefly deseribing the observed fault or faults. You will receive faster service if you include your name and telephone number (including area code and extension or department designation) in case we require additional information. If the unit has been kept at temperatures below the dew point (the temperature at which water vapour begins to condense), then it must be acclimated for a certain minimum time period before powering up. In extreme cases (if the HZ65 is much colder than the dew point), it is necessary to wait approx. It must not be operated if there is a high incidence of airborne dust, high relative humidity, risk of explosions, or if aggressive chemicals are present in the environment. The unit may be operated in any position, provided that there is unhindered air circulation (convection cooling). To the extent permitted by the applied test voltage, the forward and reverse characteristics of semiconductor components are displayed (e. Only 2-point measurements can be performed; for this reason, transistor gain and the like cannot be measured with the HZ65. Since only a few volts are applied to the test object, non-destructive testing is possible of the individual zones of almost all semiconductors. Direct in-circuit testing is possible in rnany cases, however, parallel circuits with other, complex components can cause significant changes in the curve traces. Nevertheless, with a certain amount of experience or by comparing with the traces of known functional circuits, faulty components can be quickly identified. Carry out tests with the HZ 65 only in circuits in which no currents are flowing (otherwise there is a risk of damage to the circuit and the tester). Oscilloscope types The HZ 65 can be connected to any oscilloscope with X and Y inputs (in X-Y mode or external X deflection). Testing Individual components with thin leads can be tested most quickly out-of-circuit by plugging them into one of the 2 socket contacts for testing. The included test cables can be connected to the HZ 65 for in-circuit testing of components or testing of components with leads that will riot fit into the sockets. Qualitative results are obtained by comparing with known good components of the same type and rating. For example, it is possible to quickly determine which lead is the cathode on a diode or zener diode with illegibly printed designations, to identify NPN or PNP transistors, or to obtain emitterbase-collector identification on unknown transistor types. [. . . ] For example, it is possible to quickly determine which lead is the cathode on a diode or zener diode with illegibly printed designations, to identify NPN or PNP transistors, or to obtain emitterbase-collector identification on unknown transistor types. Even more important is the ability to quickly obtain a good-bad evaluation of components in the case of interruptions or shorts, which experience has shown is what servicing jobs most often require. It is urgently advised to exercise the usual caution when handling individual MOS components as regards electrostatic charges. It is not quite as simple to obtain usable results when performing in-circuit testing. [. . . ]