User manual CADENCE DESIGN SYSTEMS ENCOUNTER DIAGNOSTICS DATASHEET

[. . . ] EnCounTEr DIAgnoSTICS Figure 1: Encounter digital IC design platform In volume mode, Encounter Diagnostics uses features such as logic-cone defect partitioning, automated fault selection, parallel runtime support, SQL-compatible G0001 DATASHEET ENCOUNTER TEST Encounter Test, a key technology in the Cadence Encounter digital IC design platform, delivers the industry's most advanced test solution from rTL to silicon. It includes three component technologies: Encounter Test Architect, to minimize cost of test; Encounter True-Time Test, to ensure quality of shipped silicon; and Encounter Diagnostics, to accelerate yield ramp. Yield loss is one of the biggest challenges with sub-90nm designs. [. . . ] Logic-cone defect partitioning helps separate faults in ICs that have multiple defects. Encounter Diagnostics XL includes patented pattern fault modeling, which allows you to define powerful customized fault models to target virtually any logical or physical (bridging) defect. If the existing test vectors cannot produce a discernable isolated fault, Encounter Diagnostics XL can create additional test vectors that will target each potential fault independently and run in an optimized fashion on probing equipment. Delay test generation · Maximize product quality Physical design Encounter True-Time Test · Stuck-at, at-speed, and faster-than-at-speed · Uses design timing to drive test timing Vectors GDSII Diagnostics · Maximize yield and ramp Silicon manufacturing Encounter Diagnostics · Volume mode finds critical yield limiters · Precision mode locates root cause Silicon Figure 2: Encounter Diagnostics database, and failsafe termination to identify the biggest yield-limiting issues. In precision mode, it pinpoints nanometer defects using capabilities such as scanchain diagnostics, advanced callout analysis, diagnostics test pattern generation, invariant analysis, and an advanced integrated guI analysis environment that supports schematic cross-probing between logic and physical models. The result is an industry-leading 80% defect identification rate as verified by physical failure analysis. Encounter Diagnostics is available in two offerings: Encounter Diagnostics XL volume and precision diagnostics, which offers four diagnostics engines and the Encounter Diagnostics XL environment, which offers four diagnostics engines, and the Encounter Diagnostics XL environment, which adds volume analysis and enhanced navigation capabilities. · X-Y location reporting of suspected defects maximizes the effectiveness of physical failure analysis lab equipment · Analyzes thousands of failed devices quickly · universal ATPg vector support enables easy integration with any flow · Patented pattern fault modeling makes it ideal for 65nm and 45nm defect identification · Increases value of existing automated yield learning system · offers a scalable solution that uses multiple processors or multiple servers and robust SQL-compatible database · Identifies scan-chain defects · Locates failures in customer field returns ENCOUNTER DIAGNOSTICS XL ENvIRONmENT The Encounter Diagnostics XL environment adds volume analysis capabilities to support volume diagnostics using the Encounter Diagnostics XL four pack. Volume diagnostics is a rapidly emerging application for systematically identifying the most critical systemic yield issues. The Encounter Diagnostics XL environment uniquely supports this application with a number of advanced features including a fully SQL-compatible database, failset analysis, parallel runtime support, failsafe termination, automated fault selection, and a data extraction programming interface. Failset analysis saves significant computation time by eliminating the need to run diagnostics on failsets for dies that are either guaranteed or highly likely to have identical diagnostics results. Parallel runtime support enables simultaneous execution across multiple processors or servers to maximize throughput. Failsafe FEATURES ENCOUNTER DIAGNOSTICS XL vOLUmE AND pRECISION DIAGNOSTICS Encounter Diagnostics XL offers volume and precision diagnostics capability via its four pack (four diagnostics engines). In precision mode, Encounter Diagnostics XL precisely locates the root cause defects in a given silicon die. [. . . ] This makes it possible to bi-directionally cross-probe between the logical schematic viewer and the physical layout browser, and also to uni-directionally cross-probe from the View Callout List function to the layout browser when CADENCE SERvICES AND SUppORT · Cadence application engineers can answer your technical questions by telephone, email, or Internet--they can also provide technical assistance and custom training · Cadence certified instructors teach more than 70 courses and bring their real-world experience into the classroom For more information, email us at info@cadence. com or visit www. cadence. com © 2007 Cadence Design Systems, Inc. Cadence and Encounter are registered trademarks and the Cadence logo is a trademark of Cadence Design Systems, Inc. [. . . ]